A system comprised of a Bomem interferometer and a LT3-110 Heli-Tran cryostat
was set up to measure the reflectance of materials in the mid-infrared spectral region.
Several tests were conducted to ensure the consistency and reliability of the system. Silicon
and Chromium, two materials with well known optical properties were measured to
test the accuracy of the system, and the results were found to be in good agreement with
Reflectance measurements on pure SnTe and several Pb and Mn-doped alloys were
carried out. These materials were chosen because they exhibit a strong plasma edge in
the mid infrared region. The optical conductivity and several related optical parameters
were calculated from the measured reflectance. Very low temperature measurements
were carried out in the far-infrared on Sn9SMn2Te, and the results are indicative of a spin
glass phase at 0.8 K.
Resistivity measurements were made at room temperature. The resistivity values
were found, as expected, to decrease with increasing carrier concentration and to increase
with increasing manganese concentration.
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