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dc.contributor.authorElsahlli, Tareg.en_US
dc.date.accessioned2009-07-09T17:34:30Z
dc.date.available2009-07-09T17:34:30Z
dc.date.issued1992-07-09T17:34:30Z
dc.identifier.urihttp://hdl.handle.net/10464/1808
dc.description.abstractA method is presented for determining the composition of thin films containing the elements Bi, Sr, Br, Cu, and Ca. Quantitative x-ray fluorescence (XRF) consisting of radioactive sources (secondary foil excitor 241Am-Mo source and 55Pe source), a Si(Li) detector, and a multichannel analyzer were employed. The XRF system was calibrated by using sol gel thin films of known element composition and also by sputtered thin films analyzed by the conventional Rutherford Back Scattering (RBS). The XRF system has been used to assist and optimize the sputter target composition required to produce high-Tc BiSrCaCuO films with the desired metal composition.en_US
dc.language.isoengen_US
dc.publisherBrock Universityen_US
dc.subjectX-ray spectroscopy.en_US
dc.subjectThin films--Analysis.en_US
dc.subjectHigh temperature superconductivity.en_US
dc.subjectSyperconductivity.en_US
dc.titleComposition analysis of high-Tc superconducting thin films by quantitative x-ray fluorescenceen_US
dc.typeElectronic Thesis or Dissertationen_US
dc.degree.nameM.Sc. Physicsen_US
dc.degree.levelMastersen_US
dc.contributor.departmentDepartment of Physicsen_US
dc.degree.disciplineFaculty of Mathematics and Scienceen_US
refterms.dateFOA2021-08-07T01:59:40Z


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