Abstract:
SrMg^Rui-iOa thin films were made by using pulsed laser deposition on
SrTiOa (100) substrates in either O2 or Ar atmosphere. The thin films
were characterized by x-ray diffraction, energy dispersive x-ray microanalysis,
dc resistivity measurement, and dc magnetization measurement. The
effect of Mg doping was observed. As soon as the amount of Mg increased in
SrMg-cRui-iOa thin films, the magnetization decreased, and the resistivity
increased. It had little effect on the Curie temperature (transition temperature).
The magnetization states of SrMgiRui-iOa thin films, for x < 0.15,
are similar to SrRuOs films. X-ray diffraction results for SrMga-Rui-iOa
thin films made in oxygen showed that the films are epitaxial. The thin films
could not be well made in Ar atmosphere during laser ablation as there was
no clear peak of SrMg^Rui-iOa in x-ray diffraction results. Substrate temperatures
had an effect on the resistivity of the films. The residual resistivity
ratios were increased by increasing substrate temperature. It was observed
that the thickness of thin films are another factor for film quality: Thin films
were epitaxial, but thicker films were not epitaxial.
