|dc.description.abstract||The purpose of this study was to identify the impact of stressors and offsetting
satistiers, measured in this study with Stress Offset Score (SOS), on intentions to quit and
examine the mediating and moderating effects of three facets of work satisfaction (job
satisfaction, pay satisfaction, and satisfaction with supervisor) and two facets of
organizational commitment (affective and nonnative commitment) on this relationship.
The sample was composed of 2990 employees from 21 public and private organizations.
The interaction of each type of work satisfaction and organizational commitment, with
SOS, was tested using Ordinary Least Squares (OLS) procedures. Intentions to quit was
the dependent variable.
The research questions were determine: (1) Does SOS predict intentions to quit? (2)
Does work satisfaction mediate the predictive relationship of SOS on intentions to quit?
(3) Does organizational commitment mediate the predictive relationship of SOS on intent
to quit? (4) Does work satisfaction moderate the predictive relationship of SOS on
intentions to quit? and (5) Does organizational commitment moderate the predictive
relationship of SOS on intentions to quit? The results indicated that SOS was negatively
correlated with intentions to quit. Each of the types of work satisfaction and
organizational commitment variables showed a partial mediated relationship with SOS
and each relationship was highly significant, while normative commitment explained
more of the relationship then other mediators. The study also tested for interactions but
no statistical significant relationships where established between any of the interaction
terms (e.g., SOSxJob Satisfaction and SOSxAffcctive Commitment) and intentions to
|dc.title||Linking of stress offset score (SOS), work satisfaction, and organizational commitment to intentions to quit||en_US
|dc.type||Electronic Thesis or Dissertation||en_US
|dc.degree.name||M.Sc. Applied Health Sciences||en_US
|dc.contributor.department||Applied Health Sciences Program||en_US