Abstract:
Perovskite manganite compounds, Lai-xDxMnOs (D-divalent alkaline earth
Ca, Sr or Ba), whose electrical and magnetic properties were first investigated
nearly a half century ago, have attracted a great deal of attention due
to their rich phase diagram.
From the point of view of designing a future application, the strong pressure
dependence of the resistivity and the accompanying effects in thin films have
potential for application in pressure sensing and electronic devices.
In this study we report our experimental investigations of pressure dependence
of the resistivity of Lao.siSvo^iQMnOs and Lai-xSvxMnOs (LSMO)
epitaxial films with x= 0.15, 0.20, 0.25, 0.30, 0.35, on SrTiOs substrates.
